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Phase-shifting grating microscope with slab-tilting method for deformation measurement

โœ Scribed by Bing Zhao; Anand Asundi


Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
739 KB
Volume
30
Category
Article
ISSN
0030-3992

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โœฆ Synopsis


In this paper, a phase-shifting grating microscope method is proposed for the deformation measurement with high sensitivity and spatial resolution. The grating image is shifted by the slab refraction eect, and is realized via a tilting compensator. A microscope is reconstructed to perform the tension test with the real time measurement of deformation. The system possesses a high spatial resolution of 1 mm, and a displacement precision of 0.03ยฑ0.1 mm.


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