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Phase-shift corrections in determining the thicknesses of transparent films on reflective substrates : W. A. Pliskin, Solid-St. Electron., 11 (1968), p. 957

Publisher: Elsevier Science
Year: 1969
Tongue: English
Weight: 109 KB
Volume: 8
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(69)90152-8

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