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Phase identification and XPS studies of Cu(In,Ga)Se2 thin films

✍ Scribed by C. Calderón; P. Bartolo-Pérez; O. Rodríguez; G. Gordillo


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
305 KB
Volume
39
Category
Article
ISSN
0026-2692

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✦ Synopsis


In this paper we present results concerning the effect of preparation conditions on the surface chemistry and crystalline phase of Cu(In,Ga)Se 2 (CIGS) thin films grown by a chemical reaction of the precursor species in two and three stage processes. The CIGS samples were studied by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis. It was found that the bulk of the samples grown in a three stage process contains mainly the CIGS phase; however, secondary phases like In 2 Se 3 , Cu 2 Se and In 2 O were additionally identified at the surface of CIGS samples grown in two stages.


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