Performance of digital integrated circuit technologies at very high temperatures: John L. Prince, Bruce L. Draper, E. A. Rapp, J. N. Kronberg and Lewis T. Fitch IEEE Trans. Components, Hybrids, Manuf. Technol. CHMT-3(4) 571 (December 1980)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 101 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(83)80187-6

✦ Synopsis

microwave characterisation based on the S parameter theory, which is commonly used in the circuit design, are described. Microstrip de-embedding techniques have been developed to shift the calibration planes of an automatic network analyser up to the device. This enables an accurate large signal GaAs PET characterisation.

Mieroelectronie test structures for characterising fine-line lithography D. S. PERLOFF, T. F. HASAN, D. H. ITWANG and J. FREY Solid-St. TechnoL p. 126 (May 1981).,

The use of microelectronic devices as test structures for characterising mask registration accuracy and feature size variations involved in fine-line lithography is described.

Interpretation of non-equilibium measurements on MOS devices using the linear voltage ramp technique L. FARAONE, J. G. SIMMONS and ANANT K. AGARWAL Solid-St. Electron. 24(8) 709 (1981).