Performance of digital integrated circuit technologies at very high temperatures : John L. Prince, Bruce L. Draper, E. A. Rapp, J. N. Kronberg and Lewis T. Fitch. IEEE Trans. Components, Hybrids, Manuf. Technol.CHMT-3 (4) 571 (December 1980)

Performance of digital integrated circui

Performance of digital integrated circuit technologies at very high temperatures: John L. Prince, Bruce L. Draper, E. A. Rapp, J. N. Kronberg and Lewis T. Fitch IEEE Trans. Components, Hybrids, Manuf. Technol. CHMT-3(4) 571 (December 1980)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 101 KB

microwave characterisation based on the S parameter theory, which is commonly used in the circuit design, are described. Microstrip de-embedding techniques have been developed to shift the calibration planes of an automatic network analyser up to the device. This enables an accurate large signal GaA