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Performance limits of electrical interconnections to a high-speed chip

✍ Scribed by Rainal, A.J.


Book ID
117872525
Publisher
IEEE
Year
1988
Tongue
English
Weight
506 KB
Volume
11
Category
Article
ISSN
0148-6411

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A new methodology to incorporate the effect of failure mechanisms into interconnection circuit performance simulation is developed. The effect of corrosion on the performance of high speed multi-chip module interconnects has been investigated. The method presented in this paper may be applied to the