Performance and Reliability of Au and Pt Single-Layer Metal Nanocrystal Flash Memory Under nand (FN/FN) Operation

✍ Scribed by Singh, P.K.; Hofmann, R.; Singh, K.K.; Krishna, N.; Mahapatra, S.

• Book ID: 114619712
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 674 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2026324