Impact of SiN Composition Variation on SANOS Memory Performance and Reliability Under nand (FN/FN) Operation

✍ Scribed by Sandhya, C.; Oak, A.B.; Chattar, N.; Joshi, A.S.; Ganguly, U.; Olsen, C.; Seutter, S.M.; Date, L.; Hung, R.; Vasi, J.; Mahapatra, S.

• Book ID: 114619829
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 593 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2033313