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Perfect crystal X-ray phase retarders

✍ Scribed by Keiichi Hirano; Tetsuya Ishikawa; Seishi Kikuta


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
775 KB
Volume
336
Category
Article
ISSN
0168-9002

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## Abstract The temperature dependence of the concentration and shape of long dislocation lines in pure, nearly perfect gallium crystals has been measured by X‐ray topography in anomalous transmission (Borrmann‐topography). The dislocation structure did not change appreciably between temperatures o