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Penetration depth of linear polarization imaging for two-layer anisotropic samples

✍ Scribed by Liao, Ran ;Zeng, Nan ;Li, Dongzhi ;Yun, Tianliang ;He, Yonghong ;Ma, Hui


Book ID
115356832
Publisher
The Optical Society
Year
2011
Tongue
English
Weight
602 KB
Volume
50
Category
Article
ISSN
1559-128X

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## Abstract A full‐wave analysis is presented for the scattering problem from a frequency‐selective surface (FSS) comprised of a periodic array of conducting patch elements on two dielectric layers. The formulation is carried out in the spectral domain, where the convolution form of the integral eq