Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were
โฆ LIBER โฆ
Peak energies and relative sensitivity factors in N(E) Auger spectra
โ Scribed by T Sekine; A Mogami; M Kudoh; K Hirata
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 601 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0042-207X
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