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Influence of secondary ion energy distributions on SIMS matrix ion intensities and relative sensitivity factors in the system GaAs/GaAlAs

✍ Scribed by C-E Richter; M Trapp; M Gericke


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
400 KB
Volume
40
Category
Article
ISSN
0042-207X

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