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Particle detectors made of high-resistivity Czochralski silicon

✍ Scribed by J. Härkönen; E. Tuovinen; P. Luukka; E. Tuominen; Z. Li; A. Ivanov; E. Verbitskaya; V. Eremin; A. Pirojenko; I. Riihimaki; A. Virtanen


Book ID
108219077
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
317 KB
Volume
541
Category
Article
ISSN
0168-9002

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We have processed full-size strip detectors on Czochralski grown silicon wafers with resistivity of about 1.2 kO cm. Wafers grown with Czochralski method intrinsically contain high concentrations of oxygen, and thus have potential for high radiation tolerance. Detectors and test diodes were irradiat