Parameter Sensitivities for Hardness Assurance: Displacement Effects in Bipolar Transistors

✍ Scribed by Smyth, John B.; van Lint, V. A. J.

• Book ID: 117930186
• Publisher: IEEE
• Year: 1977
• Tongue: English
• Weight: 600 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1977.4329171