For three-dimensional electron microscopical structure research the specimen must be imaged in a tilted position. Specimen tilt is also often needed to achieve an optimal molecular packing orientation. The tilt with respect to the optical axis causes a defocus gradient alongside the imaged area and
Parallel recording for an electron spectrometer on a Scanning Transmission Electron Microscope
โ Scribed by S.D. Berger; D. McMullan
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 270 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0304-3991
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