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PAC and CEMS study of ion-irradiated AgFe and InFe layers

✍ Scribed by M. Neubauer; K.P. Lieb; P. Schaaf; M. Uhrmacher


Book ID
107864785
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
405 KB
Volume
275
Category
Article
ISSN
0040-6090

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## Abstract Micro‐Raman studies were performed on ion‐irradiated oxidized silicon surfaces with different ion energies, ion fluences and subsequent hydrogenation to determine the efficacy and sensitivity for obtaining information on the degree of ion beam‐induced damage in very thin (__ca.__ 100 Γ…)