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P-66: Accelerated Life Test (ALT) Evaluation Method for Backlight LEDs

✍ Scribed by I-Hsun Hsieh; Kun-Hung Hsieh; Chih-Kai Wang; Wei-Chih Ke; Hsin-Mien Wang

Book ID: 118762267
Publisher: Wiley (John Wiley & Sons)
Year: 2012
Weight: 309 KB
Volume: 43
Category: Article
ISSN: 0003-966X
DOI: 10.1002/j.2168-0159.2012.tb06042.x

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