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Oxygen diffusion and defect mechanism in c-axis textured thin films of YBa2Cu3O7−xby resistivity measurements

✍ Scribed by P Kuppusami; E Mohandas; S Raju; V S Raghunathan


Book ID
110659445
Publisher
Springer-Verlag
Year
1997
Tongue
English
Weight
335 KB
Volume
20
Category
Article
ISSN
0250-4707

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