Oxygen diffusion and defect mechanism in c-axis textured thin films of YBa2Cu3O7−xby resistivity measurements
✍ Scribed by P Kuppusami; E Mohandas; S Raju; V S Raghunathan
- Book ID
- 110659445
- Publisher
- Springer-Verlag
- Year
- 1997
- Tongue
- English
- Weight
- 335 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0250-4707
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The XPS and XAES signanwe of a YBa2Cu3OT\_x thin film is analyzed in the virgin state and after several reducing and oxidizing processes. Both Ba 3d and 0 Is core level lines are found to be double and the low binding energy contributions are specific f~om the bulk thin film and are related to the ~