Influence of oxygen stoichiometry analyzed by XPS and XAES in high textured YBa2Cu3O7−x thin films

✍ Scribed by H. Guyot; L. Schmidt; R. Cinti; P.L. Reydet; J. Marcus

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 150 KB
• Volume: 162-164
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(89)90705-3

✦ Synopsis

The XPS and XAES signanwe of a YBa2Cu3OT_x thin film is analyzed in the virgin state and after several reducing and oxidizing processes. Both Ba 3d and 0 Is core level lines are found to be double and the low binding energy contributions are specific f~om the bulk thin film and are related to the ~cc of bolea. The average valence of copper is found to be oscillating between +I and +2. The film shows an oxygen poor overlayer.