Oxide thickness determination in CrSiO2Si structures by dc current-voltage pairs

✍ Scribed by X Aymerich-Humet; F Campabadal; F Serra-Mestres

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 289 KB
• Volume: 37
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(87)90321-6