Oxide thickness determination in Cr-SiO2-Si structures by dc current-voltage pairs : X. Aymerich-Humet, F. Campabadal and F. Serra-Mestres. Vacuum37, 403 (1987)

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 112 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90101-1