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Oxide roughness effect on tunneling current of MOS diodes

✍ Scribed by Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.


Book ID
114616905
Publisher
IEEE
Year
2002
Tongue
English
Weight
448 KB
Volume
49
Category
Article
ISSN
0018-9383

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