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Oxide growth at a Si surface

โœ Scribed by L. Verdi; A. Miotello; R. Kelly


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
502 KB
Volume
241
Category
Article
ISSN
0040-6090

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๐Ÿ“œ SIMILAR VOLUMES


Surface oxide layers of Si and Ge nanocr
โœ S. Hayashi; S. Tanimoto; M. Fujii; K. Yamamoto ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 537 KB

Surface oxide layers for5ed on gas-evaporated Si and Ge microcrystals as small as 1OOA were investigated by means of infrared spectroscopy, high-resolution electron Ficroscopy and X-ray photoemission spectroscopy. It is shown that 20A-thick native oxide layers in the form of SiO, with x=-1.2 are fir