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Oxide Charge Trapping Induced by Ion Implantation in SiO2

✍ Scribed by Harari, E.; Royce, B. S. H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optically induced charge storage in ion

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Ion implantation induced stoichiometric

✍ M. Offenberg; P. Balk 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 373 KB

Tapered windows in SiO2by ion implantati

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Paramagnetic defects induced by ion impl

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