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Oxidation of thin films of zirconium and Zr-Ti solid solutions on single-crystal silicon

โœ Scribed by A. M. Khoviv; I. E. Shramchenko


Book ID
110165871
Publisher
SP MAIK Nauka/Interperiodica
Year
2007
Tongue
English
Weight
171 KB
Volume
43
Category
Article
ISSN
0020-1685

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Growth and characterization of zirconium
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The growth and characterization of zirconium oxide (ZrO 2 ) thin films prepared by thermal oxidation of a deposited Zr metal layer on SiO 2 /Si were investigated. Uniform ZrO 2 thin film with smooth surface morphology was obtained. The thermal ZrO 2 films showed a polycrystalline structure. The diel