𝔖 Bobbio Scriptorium
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Overlay measurement using the low voltage scanning electron microscope

✍ Scribed by M.G. Rosenfield; A. Starikov


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
548 KB
Volume
17
Category
Article
ISSN
0167-9317

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Low-voltage scanning electron microscopi
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## Abstract Submicron ultrahigh‐molecular‐weight polyethylene (UHMWPE) wear particles from total joint prostheses may contribute to implant failure through particle‐mediated aseptic loosening. The purpose of this study was to examine the microstructure of virgin UHMWPE powder to determine its morph