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Overerase phenomena: an insight into flash memory reliability

✍ Scribed by Chimenton, A.; Pellati, P.; Olivo, P.

Book ID: 118694602
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 486 KB
Volume: 91
Category: Article
ISSN: 0018-9219
DOI: 10.1109/jproc.2003.811713

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