Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide charge storage Layer

✍ Scribed by Yan-Ny Tan; Chim, W.-K.; Byung Jin Cho; Wee-Kiong Choi

• Book ID: 114617469
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 227 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.829861