Out-of-substrate plane orientation control of thin YBa2Cu3Ox films on NdGaO3 tilted-axes substrates
✍ Scribed by Peter B. Mozhaev; Julia E. Mozhaeva; Igor K. Bdikin; Iosif M. Kotelyanskii; Valery A. Lusanov; Jørn Bindslev Hansen; Claus S. Jacobsen; Andrey L. Kholkin
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 500 KB
- Volume
- 434
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
Epitaxial heterostructures YBa 2 Cu 3 O x (YBCO)/CeO 2 /NdGaO 3 were prepared on tilted-axes NdGaO 3 substrates using laser ablation technique. Morphology, crystal structure and electrical properties of the obtained films were characterized. The seeding mechanisms are affected by the tilt angle, resulting in superior YBCO films on NdGaO 3 substrates in an intermediate range of tilt angles of 6-14°. The introduction of CeO 2 layer leads to change of the YBCO film orientation: at low deposition rate c-oriented films are formed, while at high deposition rates the film grows with c-axis tilted along the [1 1 0] NdGaO 3 direction. Bi-epitaxial films and structures were prepared by removal of part of the CeO 2 layer using ion-beam milling.
📜 SIMILAR VOLUMES
Thin YBa 2 Cu 3 O x (YBCO) films were deposited using DC-sputtering technique on NdGaO 3 substrates, tilted from (1 1 0) orientation by 0-26°. The structure and surface quality of the substrates were carefully characterized to obtain reliable results of thin films deposition. Structural, morphologic