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Orientation dependence of morphology of (Hg, Cd)Te films grown by isothermal vapor phase epitaxy

✍ Scribed by A.B. Trigubó; N.E.Walsöe de Reca

Book ID
103954698
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
551 KB
Volume
27
Category
Article
ISSN
0921-5107

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✦ Synopsis

Hg~_xCdxTe (MCT) films were grown by isothermal vapor phase epitaxy at a temperature of 593+ 1 °C for 24 h on CdTe substrates with different crystalline orientations: (i ] i)-re, (111)c0, ( 100) and ( 110). The film surfaces were observed by optical and scanning electron microscopies, and their compositions were determined using an electron microprobe. The electrical characterization was performed by Hall measurements (resistivity, carrier density and mobility). The crystalline quality of the MCT films was evaluated and the surface morphology was related to the substrate orientation.

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