Optimum simple step-stress accelerated life-tests with competing causes of failure : D. S. Bai and Y. R. Chun. IEEE Trans. Reliab. 40, 622 (1991)

• Book ID: 103285869
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 137 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90351-k