Optimum simple step-stress accelerated life tests with censoring : D. S. Bai, M. S. Kim and S. H. Lee. IEEE Trans. Reliab.38(5), 528 (1989)

• Book ID: 103287592
• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 127 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90079-m