𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Optimum sample utilization in secondary ion mass spectrometry

✍ Scribed by Helmut Liebl


Publisher
Elsevier Science
Year
1981
Weight
459 KB
Volume
191
Category
Article
ISSN
0167-5087

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Glass Sample Characterization by Seconda
✍ S. Daolio; C. Piccirillo; C. Pagura; B. Facchin; S. Zecchin; M. VeritΓ  πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 373 KB πŸ‘ 1 views

The vitreous surfaces of six samples of drawn sheet glass treated in several ways (fracture surface, polished, or immersed in acid solutions) were analysed by secondary-ion mass spectrometry (SIMS). It was shown that no changes in the samples take place under typical SIMS conditions. SIMS can reveal

Secondary ion mass spectrometry
✍ C. Kenway-Jackson πŸ“‚ Article πŸ“… 1984 πŸ› Elsevier Science 🌐 English βš– 266 KB
Determination of Trace Elements in Micro
✍ S. Yamaguchi; T. Yokoyama; T. Nomizu; H. Kawaguchi πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 345 KB

Trace elements in \(5-\mu\) l sample solutions deposited on a substrate were determined by secondary ion mass spectrometry employing the internal standard method. A simple sample mount made of copper was devised to restrict the sample residue within a small area. The absolute detection limits of 22