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Optimum reliability route in communication networks : S. S. Srivastava, R. C. Garg, A. K. Govil and S. Kumar. Microelectron. & Reliab. 11 (1972), p. 147

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 109 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90501-5

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