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Network topology for maximizing the terminal reliability in a computer communication network : Y. C. Chopra, B. S. Sohi, R. K. Tiwari and K. K. Aggarwal. Microelectron. Reliab. 24 (5) 911 (1984)


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
251 KB
Volume
26
Category
Article
ISSN
0026-2714

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