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Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data

✍ Scribed by Ventura, S. D.; Birgin, E. G.; MartiÌnez, J. M.; Chambouleyron, I.

Book ID: 120216075
Publisher: American Institute of Physics
Year: 2005
Tongue: English
Weight: 490 KB
Volume: 97
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1849431

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