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Optimization of scan procedure for single-crystal X-ray diffraction intensities

✍ Scribed by Killean, R. C. G.

Book ID: 114521444
Publisher: International Union of Crystallography
Year: 1973
Weight: 230 KB
Volume: 29
Category: Article
ISSN: 0567-7394
DOI: 10.1107/s0567739473000537

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