We analyze the effects of periodic phase shifts due to stitching errors in phase masks made by electron beam lithography. Fiber gratings written with these masks show sidebands, the strength of which is used to determine the value of the phase shift.
Optimization of reflection spectra for phase-only sampled fiber Bragg gratings
β Scribed by Isa Navruz; N. Fatma Guler
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 294 KB
- Volume
- 271
- Category
- Article
- ISSN
- 0030-4018
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