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Characterization of Long Phase Masks for Writing Fiber Bragg Gratings

✍ Scribed by François Ouellette; Peter A. Krug; Remco Pasman


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
173 KB
Volume
2
Category
Article
ISSN
1068-5200

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✦ Synopsis


We analyze the effects of periodic phase shifts due to stitching errors in phase masks made by electron beam lithography. Fiber gratings written with these masks show sidebands, the strength of which is used to determine the value of the phase shift.


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