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Optimization of process and device characteristics for MOSFETs by using the BFGS method

✍ Scribed by Kiyoyuki Yokoyama; Masaaki Tomizawa; Tadao Takeda; Akira Yoshii

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 630 KB
Volume: 27
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(84)90185-0

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