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Optimization of a high shear wet granulation process using focused beam reflectance measurement and particle vision microscope technologies

โœ Scribed by Zane Arp; Ben Smith; Eric Dycus; Des O'grady


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
572 KB
Volume
100
Category
Article
ISSN
0022-3549

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