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A PAT approach to improve process understanding of high shear wet granulation through in-line particle measurement using FBRM C35

✍ Scribed by Jun Huang; Goldi Kaul; Julia Utz; Pedro Hernandez; Victor Wong; Daragh Bradley; Arwinder Nagi; Des O'Grady


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
310 KB
Volume
99
Category
Article
ISSN
0022-3549

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