Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

✍ Scribed by Alhadeed, A.A.; Shie-Shien Yang

• Book ID: 114668338
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 292 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.2004.841704