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Optimal replacement rate of devices with lognormal failure distributions : S. S. Cheng. IEEE Trans. Reliab. R-26, (3) 174 (August 1977)

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 252 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)91006-5

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📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 94 KB