✦ LIBER ✦
Automatic electronic component failure-rate prediction with MIL-HDBK-217B : W. W. Gaertner, D. S. Elders, D. B. Ellingham, J. A. Kastning and W. M. Schreyer. IEEE Trans. Reliab.R-26, (3) 214 (August 1977)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 94 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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