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Optimal design of accelerated life tests under periodic inspection

✍ Scribed by Bong-Jin Yum; Seung-Cheol Choi

Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 671 KB
Volume: 36
Category: Article
ISSN: 0894-069X
DOI: 10.1002/1520-6750(198912)36:6<779::aid-nav3220360604>3.0.co;2-2

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