✦ LIBER ✦

Optimal design and sequential analysis of VLSI testing strategy

✍ Scribed by Yu, P.S.; Krishna, C.M.; Lee, Y.-H.

Book ID: 119771968
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 862 KB
Volume: 37
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.2171

No coin nor oath required. For personal study only.

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