Optical study of ion-induced effects in Ge20Se80−xBix thin films
✍ Scribed by P. Sharma; M. Vashistha; I.P. Jain
- Book ID
- 108233896
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 357 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0925-3467
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Thin films of chemical composition Ge 20 Se 80 and Ag 6 (Ge 0.20 Se 0.80 ) 94 are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the 400-2000 nm spectral range
Different compositions of amorphous Ge 20 Se 80 and Ge 20 Se 75 M 5 (M= Cd, Bi, or Zn) semiconducting films were deposited onto cleaned glass substrates by thermal evaporation method. The interference transmission spectra T(l) at normal incidence for Ge 20 Se 75 M 5 thin films were obtained in the w