Optical second harmonic generation study of interface magnetism
โ Scribed by G. Spierings; V. Koutsos; H.A. Wierenga; M.W.J. Prins; D. Abraham; Th. Rasing
- Publisher
- Elsevier Science
- Year
- 1993
- Weight
- 54 KB
- Volume
- 287-288
- Category
- Article
- ISSN
- 0167-2584
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We report experiments using a non-invasive second harmonic generation (SHG) technique to characterize buried Si/SiO 2 interfaces and also SIMOX thin film silicon-on-insulator (SOI) wafers. The measurements demonstrate that the SHG response can provide an indication of the quality of the buried oxide
The optical second-harmonic intensity generated by magnetic multilayers appears to depend strongly on the magnetization. Combining interface and magnetic sensitivity, magnetization-induced optical second-harmonic generation provides a unique tool to study magnetic interface properties. The underlyin