✦ LIBER ✦

Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples

✍ Scribed by Čtvrtníčková, T.; Fortes, F. J.; Cabalín, L. M.; Laserna, J. J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Auger electron spectroscopy depth profil

✍ A. Zalar; S. Hofmann; P. Panjan; V. Kraševec 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 940 KB

Direct detection of vacuum ultraviolet r

✍ LaFreniere, Bryant R.; Houk, R. S.; Fassel, Velmer A. 📂 Article 📅 1987 🏛 American Chemical Society 🌐 English ⚖ 775 KB

Restricted accessed material-copper(II)

✍ Cui, Chao; He, Man; Chen, Beibei; Hu, Bin 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 626 KB

Determination of heavy metals in activat

✍ Fábio G. Lepri; Daniel L.G. Borges; Rennan G.O. Araujo; Bernhard Welz; Frank Wen 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 837 KB